Main Departments Shared use center «nanotechnologies» Analytical services

Shared Use Center «Nanotechnologies»

Analytical services

Synchronous thermal analysis device STA 449 F5 Jupiter, combined with QMC Aeolos Quadro mass spectrometer

Conducting thermogravimetric, differential-thermal analyses, as well as differential-scanning calorimetry; Mass spectrometry of released gases in the process of thermogravimetric analysis

ChemiSorb 2750 Pulse Chemisorption Analyzer

Determination of the adsorption properties of materials (chemisorption of various gases on the surface of materials – TPD H2, CO); Determination of the surface area by the BET method; Conducting temperature-programmable reactions (TPV, TPO)

Agilent 1260 Infinity LC Liquid Chromatograph (HPLC)

Chromatogram recording on a high-performance liquid chromatograph with a diode-matrix detector (for each sample, depending on complexity, without developing a technique)

Agilent 7890A gas chromato-mass spectrometer with MSD 5975C mass-selective quadrupole detector

Recording of a chromatogram with mass spectrometry of the analyzed substances on a gas chromatograph (for each sample, depending on complexity, without developing a technique)

Energy dispersive X-ray fluorescence spectrometer ARL Quant'X

Qualitative elemental analysis (from Na to U) by EDXRF spectrometry; Quantitative elemental analysis (from Al to U) by EDXRF spectrometry (without developing an analysis technique)

Shimadzu UV-1800 Spectrophotometer

Recording of the UV spectrum of the customer's solution (without sample preparation)

Bruker Avance Neo Nuclear Magnetic Resonance (NMR) Spectrometer (300 MHz)

Registration of NMR spectra on nuclei 1H, 11B, 13C, 15N, 19F, etc., including two-dimensional methods COZY, NOESY, ROESY, TOCSY, HSQC, HMQC, HMBC, etc.

Varian 640-IR FT-IR Spectrometer

Recording of the IR spectrum (without sample preparation, without processing); Recording of the IR spectrum (with processing of the received data)

Powder X-ray diffractometer ARL X'TRA

Determination of the phase composition of polycrystalline materials by X-ray diffractometry

Scanning Probe Microscope Solver HV

Investigation of surface morphology

Quanta 200 Scanning Electron Microscope with EdaxGenesis X-Ray Microanalysis Attachment

Investigation of surface morphology; Quantitative local elemental microanalysis of the surface